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机译:采用非对称沟道双栅结构的金属诱导的横向结晶硅薄膜晶体管的扭结电流抑制改善
Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center, Daejeon 305-806, Republic of Korea;
National Nanofab Center, Daejeon 305-806, Republic of Korea;
Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center, Daejeon 305-806, Republic of Korea;
Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center, Daejeon 305-806, Republic of Korea National Nanofab Center, Daejeon 305-806, Republic of Korea;
Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center, Daejeon 305-806, Republic of Korea National Nanofab Center, Daejeon 305-806, Republic of Korea;
Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center, Daejeon 305-806, Republic of Korea National Nanofab Center, Daejeon 305-806, Republic of Korea;
机译:采用非对称双栅极设计改善多晶硅薄膜晶体管的扭结抑制
机译:金属诱导的横向结晶的多晶硅薄膜晶体管中结合了平面化栅极和重叠/偏移结构的漏电流抑制
机译:不对称沉积镍对金属诱导的横向结晶多晶硅薄膜晶体管漏电流的抑制
机译:利用改进的工艺流程和栅调制轻掺杂漏极结构抑制低温金属诱导的单晶硅多晶硅薄膜晶体管的漏电流
机译:通过晶粒增强技术形成的多晶硅薄膜晶体管的建模:金属诱导的横向结晶。
机译:表征具有双栅结构的凸起S / D无结薄膜晶体管的电性能
机译:金属诱导的横向结晶n型多晶硅薄膜晶体管的应力功率依赖性自热退化