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首页> 外文期刊>Applied Physicsletters >Kink current suppression improvement of metal-induced laterally crystallized silicon thin-film transistors employing asymmetric-channel dual-gate structure
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Kink current suppression improvement of metal-induced laterally crystallized silicon thin-film transistors employing asymmetric-channel dual-gate structure

机译:采用非对称沟道双栅结构的金属诱导的横向结晶硅薄膜晶体管的扭结电流抑制改善

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摘要

A metal-induced laterally crystallized silicon thin-film transistor (TFT) with an asymmetric-channel dual-gate structure was fabricated and characterized. It features a sub-TFT near the drain with multichannel consisting of narrower unit channel width, resulting in higher field-effect mobility compared to a sub-TFT near the source with single-channel. The proposed TFT effectively suppressed the kink current with a field-effect mobility to be almost on a level with the conventional single-gate TFT. This improvement was explained by measurement of floating voltages revealing that the sub-TFT near the source of the proposed TFT operates in the near saturation regime under high drain voltages.
机译:制备并表征了具有非对称沟道双栅结构的金属诱导的横向结晶硅薄膜晶体管(TFT)。与靠近单通道源极的子TFT相比,它的漏极附近具有多沟道的子TFT具有更窄的单位沟道宽度,从而具有更高的场效应迁移率。所提出的TFT有效地将具有场效应迁移率的扭结电流抑制到与常规单栅TFT几乎相同的水平。通过测量浮动电压可以解释此改进,该浮动电压揭示了所提议TFT的源极附近的子TFT在高漏极电压下以接近饱和状态工作。

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  • 来源
    《Applied Physicsletters》 |2009年第10期|136-138|共3页
  • 作者单位

    Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center, Daejeon 305-806, Republic of Korea;

    National Nanofab Center, Daejeon 305-806, Republic of Korea;

    Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center, Daejeon 305-806, Republic of Korea;

    Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center, Daejeon 305-806, Republic of Korea National Nanofab Center, Daejeon 305-806, Republic of Korea;

    Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center, Daejeon 305-806, Republic of Korea National Nanofab Center, Daejeon 305-806, Republic of Korea;

    Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center, Daejeon 305-806, Republic of Korea National Nanofab Center, Daejeon 305-806, Republic of Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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