MOlybdenum carbide and diamond films were deposited at room termperature by dielectrophoresis on molybdenum foil and field emission tips. FIlms deposited on flat surfaces were characterized with XPS, UPS and SEM. Field emission Fowler-Nordheim current-voltage characteristics and electron energy distribution measurements were obtained using films deposited on field emission tips as part of a single aperture gated diode in a VG ESCALAB II system. Molybdenum trioxide was present after molybdenum carbide deposition at room temperature on all samples. At a temperature of about 650 deg C, the dominant oxide changes to molybdenum dioxide. At about 800 deg C, the oxygen content of the films significantly decreases and molybdenum carbide with significant graphite content remains. The UPS data for these samples were obtained at different annealing temperatures and a number of photon energies to determine photoelectric work functions for molybdenum trioxide, molybdenum dioxide and molybdenum carbide. The sanme kind of data was obtained for diamond deposited on molybdenum and molybdenum carbide coated foils and field emission tips.
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