【24h】

Thermal fatigue lifeevaluation for the solder joint ceramic BGA

机译:焊点陶瓷BGA的热疲劳寿命评估

获取原文

摘要

In this paper, solder joint fatigue life is examined by experimental evaluation and finite element analysis. We evaluate the ceramic BGA package solder joint reliability under thermal stresses. To eonfirm the validity of FEM analysis, we compare the initial cracking position caused by thermal stress to the maximum nonlinear strain position determined by the FEM analysis Alos, we compare the experimental warpage of package and substrate caused by the temperature change to the calculated warpage. The FEM results agree well with the experimental ones. The FEM analysis is effective for the evaluation of the package design.
机译:本文通过实验评估和有限元分析来检查焊点疲劳寿命。我们评估了在热应力下陶瓷BGA封装焊点的可靠性。为了确定FEM分析的有效性,我们将热应力引起的初始开裂位置与FEM分析Alos确定的最大非线性应变位置进行了比较,将温度变化引起的封装和基板的实验翘曲与计算出的翘曲进行了比较。有限元结果与实验结果吻合良好。 FEM分析对于评估包装设计非常有效。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号