首页> 外国专利> LEAD-FREE SOLDER-JOINT PART FATIGUE LIFE PREDICTION SYSTEM, LEAD-FREE SOLDER-JOINT PART FATIGUE LIFE PREDICTION METHOD, AND PROGRAM

LEAD-FREE SOLDER-JOINT PART FATIGUE LIFE PREDICTION SYSTEM, LEAD-FREE SOLDER-JOINT PART FATIGUE LIFE PREDICTION METHOD, AND PROGRAM

机译:无铅焊点疲劳寿命预测系统,无铅焊点疲劳寿命预测方法和程序

摘要

PROBLEM TO BE SOLVED: To provide a solder-joint part fatigue life prediction system for performing fatigue life prediction on a lead-free solder-joint part with high accuracy without requiring expertise.;SOLUTION: This system is equipped with a storage part 50 stored with dimension data on a radical model of a semiconductor package, a storage part 51 stored with structure expression data on lead-free solder, a storage part 53 stored with fatigue strength data on a lead-free solder material, and a processing part 20. The processing part 20 prepares analysis model data by changing the dimension data on the radical model; performs stress analysis on the semiconductor package mounted on a substrate, based on the analysis model data, the structure expression data, deformation characteristics on the semiconductor package and substrate material, and temperature cycle conditions; calculates a transient strain rate component and a steady-state strain rate component; calculates an equivalent non-elastic strain quantity at a strain-centered position; and thereby calculates a fatigue life.;COPYRIGHT: (C)2004,JPO&NCIPI
机译:解决的问题:提供一种焊点疲劳寿命预测系统,该技术无需专业知识即可对无铅焊点部件进行高精度的疲劳寿命预测;解决方案:该系统配备了一个存储50的存储部件具有关于半导体封装的基本模型的尺寸数据,存储有关于无铅焊料的结构表达数据的存储部51,存储有关于无铅焊料的疲劳强度数据的存储部53以及处理部20。处理部20通过改变基本模型的尺寸数据来准备分析模型数据。根据分析模型数据,结构表达式数据,半导体封装和基板材料的变形特性以及温度循环条件,对安装在基板上的半导体封装进行应力分析;计算瞬态应变率分量和稳态应变率分量;计算以应变为中心的位置的等效非弹性应变量;从而计算出疲劳寿命。;版权所有:(C)2004,JPO&NCIPI

著录项

  • 公开/公告号JP2004251651A

    专利类型

  • 公开/公告日2004-09-09

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP20030039749

  • 申请日2003-02-18

  • 分类号G01N3/32;H05K3/34;

  • 国家 JP

  • 入库时间 2022-08-21 23:29:57

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