首页> 外文会议>Conference on High Density Microsystem Design and Packaging and Component Failure Analysis >The Microstructure of Eutectic Au-Sn and In-Sn Solders on Au/Ti and Au/Ni Metallizations during Laser Solder Bonding Process for Optical Fiber Alignment
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The Microstructure of Eutectic Au-Sn and In-Sn Solders on Au/Ti and Au/Ni Metallizations during Laser Solder Bonding Process for Optical Fiber Alignment

机译:用于光纤焊接过程中Au / Ti和Au / Ni金属化的共晶Au-Sn和Sn-Sn焊料的微观结构

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In this work, two eutectic solders: 80Au20Sn and 52In48Sn were chosen for fiber bonding through laser soldering, and Scanning Electronic Microscope (SEM) equipped with Energy Dispersive X-ray Detector (EDX) was used to investigate the microstructures of at four interfaces between two solders and two metallizations: Au-Sn/(Au/Ti), Au-Sn/(Au/Ni), In-Sn/(Au/Ti), In-Sn/(Au/Ni). Results show that as for the Au-Sn solder joint a large amount of ζ-phase was formed at the Au-Sn/(Au/Ti) interface with its morphology closely related with laser input energy; while at the Au-Sn/(Au/Ni) interface scallop-like (Au,Ni)Sn appeared with a low input energy and irregular-shaped (Au,Ni){sub}3Sn{sub}2 emerged with a high input energy. As for the In-Sn solder, the IMCs at the In-Sn/(Au/Ti) interface transformed, from a Au(In,Sn){sub}2 layer to isolated AuIn{sub}2 cubes with the increase of input energy while at the In-Sn/(Au/Ni) interface a thin layer of Au(In,Sn){sub}2 was formed. As the connecting layer, Ti did not react in the soldering process.
机译:在这项工作中,选择了两种共晶焊料:通过激光焊接选择80Au20SN和52In48SN,并通过激光焊接进行纤维粘合,并配备有能量分散X射线检测器(EDX)的扫描电子显微镜(SEM)来研究两个之间的四个接口的微观结构焊料和两种金属化:AU-SN /(AU / TI),AU-SN /(AU / NI),IN-SN /(AU / TI),IN-SN /(AU / NI)。结果表明,作为Au-Sn系焊料接头大量ζ相的混合物在该Au-Sn形成/(对Au / Ti)与它的形态与激光输入能量密切相关的接口;虽然在AU-SN /(AU / NI)界面扇贝样(AU,NI)SN中出现具有低输入能量和不规则形状(AU,NI){SUB} 3S2的高输入活力。至于IN-SN焊料,IN-SN /(AU / TI)界面处的IMC从AU(IN,SN)2层转换为分离的Auin {Sub} 2立方体随着输入的增加在SN-SN /(AU / NI)界面处的能量形成薄层Au(In,Sn){sub} 2。作为连接层,Ti在焊接过程中没有反应。

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