Structure-property relastionships in SrRuO_3 epitaxial thin films

摘要

Epitaxial SrRuO_3 films were prepared on (001) SrTiO_3 substrates by pulsed laser deposition. The film structure was characterized by 4-circle x-ray diffraction and the electrical deposition. The film structure was characterized by 4-circlex-ray diffraction and the electrical behavior by temperature dependent resistivity measuremdents. With variations in the deposition conditions, significant changesin both structural and electricla properties were observed. When deposited under conditions favoring appreciable energetic bombardment, the SrRuO_3 films on SrTiO_3 exhibited extended in and out-of-plane lattice constants and increasedvalues of resistivity; in addition, a depression of the Curie temperature was measured. SrRuO_3 deposited under less aggressive conditions displayed structures and properties more similar to those associated with bulk crystals.