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Structure-property relationship of Co2MnSi thin films in response to He+-irradiation

机译:Co2MnSi薄膜对He +辐照的结构-性质关系

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摘要

We investigated the structure-property relationship of Co2MnSi Heusler thin films upon the irradiation with He+ ions. The variation of the crystal structure with increasing ion fluence has been probed using nuclear magnetic resonance (NMR) and transmission electron microscopy (TEM), and associated with the corresponding changes of the magnetic behavior. A decrease of both the structural order and the moment in saturation is observed. Specifically, we detect a direct transition from a highly L21-ordered to a fully A2-disordered structure type and quantify the evolution of the A2 structural contribution as a function of ion fluence. Complementary TEM analysis reveals a spatially-resolved distribution of the L21 and A2 phases showing that the A2 disorder starts at the upper part of the films. The structural degradation in turn leads to a decreasing magnetic moment in saturation in response to the increasing fluence.
机译:我们研究了He + 离子辐照下Co2MnSi Heusler薄膜的结构性质关系。已经使用核磁共振(NMR)和透射电子显微镜(TEM)探索了随着离子通量增加而产生的晶体结构变化,并与磁行为的相应变化相关联。观察到结构顺序和饱和力矩的降低。具体来说,我们检测到从高度L21有序到完全A2无序的结构类型的直接过渡,并量化了A2结构贡献随离子通量的变化。互补TEM分析揭示了L21和A2相的空间分辨分布,表明A2无序始于膜的上部。响应于增加的通量,结构退化进而导致饱和磁矩减小。

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