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Vibration fatigue of μBGA solder joint

机译:μBGA焊点的振动疲劳

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This paper studies the vibration fatigue failure of μBGAsolder-joints reflowed with different temperature profiles, and ageingat 120° C for 1, 4, 9, 16, 25, 36 days. The effect of the thicknessof the Ni3Sn4 and Cu-Sn intermetallic compound(IMC) on the fatigue lifetime is also reported. During the vibrationfatigue test, in order to identify the failure of μBGA solder joint,electrical interruption was monitored continuously through thedaisy-chain network. Our results show that the fatigue lifetime of thesolder joint firstly increases and then decreases with increasingheating factor (Qn), which is defined as the integral of themeasured temperature over the dwell time above liquidus (183° C) inthe reflow profile. The greatest lifetime occurs when Qn isnear 500 s° C. Moreover, the lifetime of the solder joint decreaseslinearly with the increasing fourth root of the ageing time. The SEM/EDXinspection shows that only Ni3Sn4 IMC and Cu6Sn5/Cu3Sn IMCs are formed between the solderand the nickel-plated PCB pad, and the solder/component-metallizationinterface respectively. For non-aged samples reflowed with differentprofiles, the fatigue crack generally initiates at valleys in the roughsurface of the interface of the Ni3Sn4 IMC withthe bulk solder. Then it propagates mostly near the Ni/solder, andoccasionally in the IMC layer or along the Ni/solder interface. For agedsamples, the fatigue crack mostly initiates and propagates in theCu6Sn5-phase/bulksolder interface or the Cu3Sn/Cu6Sn5 interface oncomponent-metallization. Evidently, the intermetallic compoundscontribute mainly to the fatigue failure of μBGA solder joints. Thethicker the IMC layer, the shorter the fatigue lifetime of solder joint.The initial formation of the IMCs at the interface during solderingensures a good metallurgical bond between the solder and the substrate.However, a thick IMC layer influences the solder joint strength, whichresults in mechanical failure due to volume shrinkage during thetransformation from solid phase to the intermetallic compound
机译:本文研究了μBGA的振动疲劳破坏 焊点在不同温度曲线下的回流和老化 在120°C下放置1、4、9、16、25、36天。厚度的影响 Ni 3 Sn 4 和Cu-Sn金属间化合物的合成 (IMC)的疲劳寿命也有报道。振动期间 疲劳测试,以识别μBGA焊点的故障, 通过 菊花链网络。我们的结果表明,疲劳寿命 焊点先增加后减少 加热因子(Q n ),定义为 在高于液相线(183°C)的停留时间内测得的温度 回流配置文件。当Q n 为 接近500 s°C。此外,焊点的寿命缩短 与衰老时间的第四根成正比。 SEM / EDX 检查显示只有Ni 3 Sn 4 IMC和Cu 6 在焊料之间形成 Sn 5 / Cu 3 Sn IMC 和镀镍的PCB焊盘,以及焊料/组件金属化 接口。对于未老化的样品,采用不同的回流 轮廓,疲劳裂纹通常在粗糙的山谷开始 Ni 3 Sn 4 IMC与 散装焊料。然后,它主要在镍/焊料附近传播,并且 偶尔在IMC层中或沿Ni /焊料界面。对于老年人 样品中,疲劳裂纹主要在玻璃中开始并扩展。 Cu 6 Sn 5 相/体焊接界面或Cu 3 Sn / Cu 6 Sn 5 接口 组件金属化。显然,金属间化合物 主要原因是μBGA焊点的疲劳失效。这 IMC层越厚,焊点的疲劳寿命越短。 焊接过程中界面上的IMC的初始形成 确保焊料和基材之间的良好冶金结合。 但是,较厚的IMC层会影响焊点强度, 由于在压缩过程中体积缩小而导致机械故障 从固相到金属间化合物的转变

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