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Vibration fatigue reliability of BGA-IC package with Pb-free solder and Pb-Sn solder

机译:无铅焊料和铅锡焊料的BGA-IC封装的振动疲劳可靠性

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摘要

In this paper, a new method is proposed for evaluating the high-cycle fatigue strength of BGA (Ball Grid Array) packages with Pb-free solder and Pb-Sn solder due to vibration. An attached weight induced mixed mode stress in the solder ball of a package was used. To consider the effect of the mixed mode stress that occurred in a solder ball and the frequency to fatigue strength of the solder ball, a test was carried out with the three kinds of weights (σ_n/τ_n = 4, 5, and 6) at various frequencies (10-27 Hz). To clarify the effect of frequency, a nonlinear analysis with a visco-plastic model was carried out within the range of 0.001-3450 Hz. From the continuous observation of the cross-section of the package and finite element method (FEM) analysis results, it was revealed that the maximum principal stress is the driving force to package failure. Although an intermetallic compound in both packages and a Pb-rich region in a Pb-Sn solder based package were confirmed by EDX microprobe analysis, they do not contribute to the initiation of a crack in a solder ball. The fatigue strength of the Pb-free solder and Pb solder was evaluated on the basis of the maximum principal stress calculated by FEM and the experimental results.
机译:本文提出了一种评估无铅焊料和铅锡焊料振动引起的BGA(球栅阵列)封装的高周疲劳强度的新方法。在封装的焊球中使用了附着的重量引起的混合模式应力。为了考虑在焊球中产生的混合模式应力的影响以及焊球对疲劳强度的频率,使用三种权重(σ_n/τ_n= 4、5和6)进行了测试。各种频率(10-27 Hz)。为了阐明频率的影响,在0.001-3450 Hz范围内使用粘塑性模型进行了非线性分析。通过连续观察包装的横截面和有限元方法(FEM)分析结果,发现最大主应力是导致包装失效的驱动力。尽管通过EDX微型探针分析已确认两种封装中的金属间化合物以及Pb-Sn焊料基封装中的Pb富集区域,但它们不会助长焊料球中的裂纹。基于FEM计算的最大主应力和实验结果,评估了无铅焊料和Pb焊料的疲劳强度。

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