首页> 外文会议>2011 IEEE Compound Semiconductor Integrated Circuit Symposium : Integrated Circuits in GaAs, InP, SiGe, GaN and Other compound Semiconductors : Technical Digest 2011 >Novel HEMT Models with Improved Higher-Order Derivatives and Extracting Their Parameters Using Multibias S-Parameters
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Novel HEMT Models with Improved Higher-Order Derivatives and Extracting Their Parameters Using Multibias S-Parameters

机译:具有改进的高阶导数的新型HEMT模型,并使用多偏置S参数提取其参数

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Novel two HEMT models are suggested in the paper with improved accuracy of higher-order derivatives, which is very important for modeling radio-frequency devices as mixers, etc. The proposed modifications of the models are based on empirical relations for the transconductance dependence on gate-source voltage. Moreover, a way is suggested how to extract the model parameters of various nonlinear HEMT models from a measured multibias s-parameter data set. The proposed extraction procedure is based on a three-step identification procedure that uses robust optimization methods. Finally, various HEMT models -- including the proposed ones -- are compared in terms of the root-mean-square error of DC characteristics and multibias s-parameters.
机译:本文提出了一种新的两个HEMT模型,提高了高阶导数的准确性,这对于将射频器件建模为混合器非常重要。该模型的建议修改基于对栅极的跨导依赖性的经验关系 - 源电压。此外,建议如何从测量的多束S参数数据集中提取各种非线性HEMT模型的模型参数。所提出的提取程序基于三步识别程序,它使用稳健的优化方法。最后,在DC特性的根均方误差和多束S参数方面比较了各种HEMT模型 - 包括所提出的模型。

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