首页> 外国专利> ALGAN/GAN HEMT SMALL-SIGNAL MODEL AND METHOD FOR EXTRACTING PARAMETERS THEREOF

ALGAN/GAN HEMT SMALL-SIGNAL MODEL AND METHOD FOR EXTRACTING PARAMETERS THEREOF

机译:ALGAN / GAN HEMT小信号模型及其参数提取方法

摘要

The invention relates to an AlGaN/GaN HEMT small-signal model and a method for extracting parameters thereof. According to the AlGaN/GaN HEMT small-signal model of the invention, based on a conventional AlGaN/GaN HEMT small-signal model, a first coplanar waveguide capacitor (I) between a gate and a source and a second coplanar waveguide capacitor (II) between the gate and a drain are added in a parasitic unit. Since an AlGaN/GaN HEMT device and a coplanar waveguide device have similar structures, by introducing the first coplanar waveguide capacitor (I) and the second coplanar waveguide capacitor (II) under a high-frequency condition, that is, considering the fact that the coplanar waveguide effect of the AlGaN/GaN HEMT device will introduce additional parasitic capacitances, the working state and device characteristics of the AlGaN/GaN HEMT device can be reflected more accurately, and the accuracy of the device model is improved.
机译:本发明涉及一种AlGaN / GaN HEMT小信号模型及其参数提取方法。根据本发明的AlGaN / GaN HEMT小信号模型,基于常规的AlGaN / GaN HEMT小信号模型,在栅极和源极之间的第一共面波导电容器(I)和第二共面波导电容器(II栅极和漏极之间的)寄生单元中添加。由于AlGaN / GaN HEMT器件和共面波导器件具有相似的结构,因此通过在高频条件下引入第一共面波导电容器(I)和第二共面波导电容器(II),即考虑到AlGaN / GaN HEMT器件的共面波导效应将引入额外的寄生电容,可以更准确地反映AlGaN / GaN HEMT器件的工作状态和器件特性,并提高了器件模型的准确性。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号