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Cost-efficient fabrication of UV/Vis nanowire (NW) photodiodes enabled by ZnO/Si radial heterojunction

机译:通过ZnO / Si径向异质结实现的高性价比UV / Vis纳米线(NW)光电二极管制造

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Radial heterojunction nanowires (NWs) using a ZnO(shell)/Si(core) coaxial structure are for the first time reported for a novel photodiode application. Strong antireflective characteristics are shown by employing vertically aligned Si NW arrays. A thin ZnO shell deposited onto a Si NW formed a radial junction which enabled effective separation of charge carriers. Furthermore, a ZnO nanostructure demonstrates a very high internal gain in photoconductivity due to the surface-enhanced electron-hole separation. The photodetection range, either ultraviolet (UV) or visible, can be determined by applying forward or reverse bias, respectively. Compared to a planar heterojunction photodiode, a photoresponsivity of the radial heterojunction structure shows similar values despite only ∼20% consumption of a ZnO thickness required for a planar junction. In addition, ∼2.5 times increase in UV responsivity is also presented using the radial heterojunction structure under the ZnO thickness same as a planar counterpart. Our coaxial ZnO/Si NW photodetectors suggest bright prospect for enhancing a photoresponsivity while less consuming ZnO via controlling the wired nanostructure.
机译:首次报道了使用ZnO(壳)/ Si(芯)同轴结构的径向异质结纳米线(NWs)用于新型光电二极管应用。通过采用垂直排列的Si NW阵列显示出很强的抗反射特性。沉积在Si NW上的ZnO薄壳形成了一个径向结,可以有效分离载流子。此外,由于表面增强的电子-空穴分离,ZnO纳米结构在光电导性方面显示出非常高的内部增益。可以分别通过施加正向或反向偏置来确定紫外线(UV)或可见光的光电检测范围。与平面异质结光电二极管相比,径向异质结结构的光响应性显示了相似的值,尽管平面结所需的ZnO厚度仅消耗约20%。此外,在与平面对应物相同的ZnO厚度下,使用径向异质结结构还可以使紫外线响应率提高约2.5倍。我们的同轴ZnO / Si NW光电探测器为提高光响应性提供了广阔的前景,同时可通过控制有线纳米结构来减少ZnO的消耗。

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