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首页> 外文期刊>Journal of materials science >Characterization of budding twigs of flower-type zinc oxide nanocrystals for the fabrication and study of nano-ZnO/p-Si heterojunction UV light photodiode
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Characterization of budding twigs of flower-type zinc oxide nanocrystals for the fabrication and study of nano-ZnO/p-Si heterojunction UV light photodiode

机译:纳米ZnO / P-Si杂交UV光电二极管萃取型氧化锌纳米晶体萌芽枝芽的特征及研究

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摘要

In this work, we focused on the study of the structural and optical properties of chemical precipitation-derived special shape (budding twigs of flower-type) ZnO nanostructures for optoelectronic and photodetection applications. The structural and optical properties of the budding twigs of Jasminum flower-like ZnO nanocrystals have been studied and discussed in detail from the XRD, HRTEM, UV-Vis, and photoluminescence spectra. The grown ZnO nanocrystals have been coated on the p-Si substrate to fabricate nano-ZnO/p-Si heterojunction photodiode. The junction properties of the fabricated photodiode were examined by measuring ultraviolet (UV)-light-dependant (λ ~ 366 nm) and dark condition current (I)-voltage (V) as well as capacitance (C)-voltage (V) characteristics. The photodetection properties of the diode in the UV light region have been examined. The diode has well-defined rectifying behavior with a photoresponsivity and external photodetection efficiency of 0.065 and 21.5%, respectively. The observed barrier height and donor concentration under dark condition were ≈ 0.25 eV and 2 × 10~(17) cm~(-3), respectively. The change in heterojunction capacitance, barrier height, the depletion width, and other parameters of the heterojunction photodiode under UV illumination has been discussed. The qualities of the device demonstrate that it tends to be used for UV photodetection applications in nano-optoelectronic and photonic devices.
机译:在这项工作中,我们专注于研究化学沉淀衍生的特殊形状(花型萌芽枝)ZnO纳米结构用于光电和光电检测应用的结构和光学性质的研究。已经研究了Jasminum花样ZnO纳米晶体的萌芽树枝的结构和光学性质,并详细讨论了XRD,HRTEM,UV-Vis和光致发光光谱。已经涂覆了生长的ZnO纳米晶体在P-Si底物上涂覆以制造纳米ZnO / P-Si异质结光电二极管。通过测量紫外线(UV) - 灯(λ〜366nm)和暗状态电流(I) - 电压(V)以及电容(C) - 电压(V)特性来检查制造光电二极管的结性。 。已经检查了UV光区域中二极管的光检测特性。二极管具有明确定义的整流行为,分别具有0.065和21.5%的光反对子和外部光电探测效率。在暗条件下观察到的屏障高度和供体浓度分别为≈0.25eV和2×10〜(17)cm〜(-3)。已经讨论过UV照明在UV照明下的异质结电容,屏障高度,耗尽宽度和其他参数的变化。该装置的品质表明它倾向于用于纳米光电和光子器件中的UV光电检测应用。

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  • 来源
    《Journal of materials science》 |2021年第8期|9912-9928|共17页
  • 作者单位

    Department of Physics Government General Degree College at Gopiballavpur-ll Beliaberah Jhargram West Bengal 721517 India;

    Department of Physics Vidyasagar University Paschim Medinipur Midnapore West Bengal 721102 India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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