首页> 外文会议>Indium Phosphide and Related Materials, 1998 International Conference on >New results for nonstoichiometric InP grown by low temperature MBE
【24h】

New results for nonstoichiometric InP grown by low temperature MBE

机译:低温MBE生长非化学计量InP的新结果

获取原文

摘要

We report the first observation of lattice contraction in nonstoichiometric InP grown by low temperature MBE. The lattice contraction is caused by P antisite defects, that is the smaller P atom occupying a group III lattice site that the larger In atom would normally occupy. We have studied the MBE growth of InP over a temperature range from 150-350C. We show that there is a narrow range of growth temperatures where crystalline InP can be grown with a measurable amount of excess P. The InP layers grown below this temperature range will incorporate very large amounts of excess P and become amorphous, while InP layers grown above this temperature range will not have measurable amounts of excess P. The as-grown InP is very conducting because the P antisite behaves as a shallow donor. Our TEM images of annealed crystalline nonstoichiometric InP show that P precipitates are formed. As the P precipitates are formed, the conductivity decreases. The crystalline nonstoichiometric InP behaves analogously to low temperature grown GaAs. However, for the amorphous InP samples grown at lower growth temperatures the conductivity increases with anneal. The different growth regimes that we describe in this paper may help to explain the varied results obtained in previous reports on LT InP.
机译:我们报告了低温MBE生长的非化学计量InP中晶格收缩的首次观察。晶格收缩是由P反位缺陷引起的,也就是说,较小的P原子会占据较大的In原子通常占据的III族晶格位。我们研究了InP在150-350℃温度范围内MBE的生长。我们表明,在生长温度范围狭窄的情况下,可以以可测量的过量P量生长晶体InP。在此温度范围以下生长的InP层将掺入大量过量的P并变为非晶态,而在此温度以上生长的InP层在这个温度范围内,不会测量到过量的P。生长中的InP非常导电,因为P的反位点表现为较浅的供体。我们的退火晶体非化学计量InP的TEM图像显示形成了P沉淀。随着P沉淀物的形成,电导率降低。晶体非化学计量InP的行为类似于低温生长的GaAs。但是,对于在较低生长温度下生长的非晶InP样品,电导率随退火而增加。我们在本文中描述的不同生长方式可能有助于解释先前关于LT InP的报告中获得的不同结果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号