首页> 外文会议>Electronic Components and Technology Conference, 1994. Proceedings., 44th >Development of a new flip-chip bonding process using multi-stacked /spl mu/-Au bumps
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Development of a new flip-chip bonding process using multi-stacked /spl mu/-Au bumps

机译:利用多层/ spl mu / -Au凸块开发新的倒装芯片接合工艺

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A novel flip-chip bonding (FCB) process was developed for improving the packaging of high frequency ICs operating at more than 10 GHz. This process, which uses multi-stacked /spl mu/-Au bumps, a lower apparatus cost than that of the FCB process using PbSn bumps. Tests have confirmed that the new FCB process is sufficiently reliable and that ICs made with this process has satisfactory high-frequency characteristics in IC operation of up to 15 GHz.
机译:开发了一种新颖的倒装芯片键合(FCB)工艺,以改善工作在10 GHz以上的高频IC的封装。此过程使用多层堆叠的/ spl mu / -Au凸块,其设备成本比使用PbSn凸块的FCB过程要低。测试已经证实,新的FCB工艺具有足够的可靠性,并且使用该工艺制造的IC在高达15 GHz的IC运行中具有令人满意的高频特性。

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