【24h】

POINT OF USE ABATEMENT UNIT BY-PASS FOR NF_3-BASED CVD CHAMBER CLEAN APPLICATIONS

机译:基于NF_3的CVD腔清洁应用的使用清除单位旁通点

获取原文
获取原文并翻译 | 示例

摘要

The conversion of NF_3-based CVD chamber cleans from previously used gases, such as CF_4 and C_2F_6, has resulted in significant reduction in PFC emissions but has greatly increased the amount of fluorine in the clean effluent. This increase in F_2 emissions can cause accelerated corrosion in point of use abatement units and corresponding exhaust infrastructure under certain conditions. One solution to this corrosion problem is a bypass loop for the abatement unit. In this design, chamber clean gases are routed directly to the fab exhaust while process gases are directed to the abatement unit. The abatement unit is no longer subjected to high concentrations of F_2, thus reducing the instances of failure by corrosion.
机译:基于NF_3的CVD腔室从先前使用的气体(例如CF_4和C_2F_6)转换成的清洁气体,大大减少了PFC排放,但大大增加了清洁流出物中的氟含量。 F_2排放物的这种增加会在某些条件下导致使用点减排装置和相应排气基础设施的加速腐蚀。解决腐蚀问题的一种方法是减少单元的旁路回路。在这种设计中,腔室清洁气体被直接引导至工厂排气,而工艺气体被引导至减排单元。消除单元不再经受高浓度的F_2,因此减少了因腐蚀而导致失效的情况。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号