Polycrystalline CdZnTe Thick Films for Low Energy X-ray: System Evaluation

摘要

The X-ray response of polycrystalline-CdZnTe was measured by signal-to-noise (S/N) analysis. The CdZnTe material has optimal properties in a solid-state X-ray detector, and much research has focused on single crystal CdZnTe with a small-sized, silicon rea