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Type conversion of polycrystalline CdZnTe thick films by multiple compensation

机译:多补偿CdZnTe多晶厚膜的类型转换

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摘要

The multiple compensated polycrystalline CdZnTe thick films have been deposited by thermal evaporation method. The heavy metals of Pb and Sn have been co-doped with Cl in order to fully compensate Cd vacancies in polycrystalline CdZnTe films due to the limited solubility of Cl in CdZnTe. The drastic variations of the resistivity and conduction type in the CdZnTe films were observed by doping with heavy metals. The intensity of A-center levels, which are normally found in a compensated single CdZnTe crystal, was decreased along with the increase of resistivity in polycrystalline CdZnTe samples. The electron mobility is about 88 cm~2/Vs, and a well resolved gamma ray spectrum of ~(241)Am has been observed for these polycrystalline CdZnTe thick films for the first time.
机译:已经通过热蒸发法沉积了多个补偿的多晶CdZnTe厚膜。由于Cl在CdZnTe中的溶解度有限,Pb和Sn的重金属已与Cl共掺杂,以完全补偿多晶CdZnTe膜中的Cd空位。通过掺入重金属可以观察到CdZnTe薄膜电阻率和导电类型的急剧变化。通常在补偿的单CdZnTe晶体中发现的A中心能级的强度随着多晶CdZnTe样品中电阻率的增加而降低。电子迁移率约为88 cm〜2 / Vs,并且首次对这些多晶CdZnTe厚膜观察到了良好的〜(241)Am伽马射线谱。

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