首页> 外文会议>2010 27th International Conference on Microelectronics Proceedings >Micromachining by maskless wet anisotropic etching {hkl} structures on {100} oriented silicon
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Micromachining by maskless wet anisotropic etching {hkl} structures on {100} oriented silicon

机译:通过在{100}取向的硅上进行无掩模湿法各向异性腐蚀{hkl}结构进行微加工

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The paper presents investigation of micromechanical technique using 3D anisotropically etched Si structures. Ridge-like structure oriented along (110) direction is first etched with mask following maskless etching in 25 wt. % TMAH solution in water at 80 °C. The ridge structures investigated by maskless etching are convex prismatic edges included by {100} and {111} planes. Experimental results verify that the cutting planes developed at the ridge corners are {733} planes. From analytical relations applied to experiments, the ratio between the etching rates for the {733} (the fastest etching plane at the edge step) and {100} planes is found.
机译:本文介绍了使用3D各向异性刻蚀的Si结构的微机械技术的研究。沿(110)方向取向的脊状结构首先在25 wt。在80°C的水中的%TMAH溶液。通过无掩模蚀刻研究的脊结构是{100}和{111}平面所包括的凸棱形边缘。实验结果证明,在棱角处形成的切割平面为{733}平面。从应用于实验的分析关系中,可以得出{733}(边缘台阶处最快的蚀刻平面)和{100}平面的蚀刻速率之比。

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