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Manufacturing technology of microelectronic devices

机译:微电子器件的制造技术

摘要

The invention relates to a method for manufacturing a microelectronic device from a semiconductor substrate on an insulator, which comprises an active element (23) formed in an active region of the substrate (10) separated by an insulating groove and defined by a first side wall (19b),Since the insulating trench is at least partially filled with a first dielectric material, the process includes: chemically etching the passive part (21) at the first bottom of the insulating trench to produce The secondary average value of roughness is between 2 nm and 6 nm, which is a step of passive component formation (27),At the top of the first dielectric material and at the protrusion of the passive part (21).Abstract figure: figure 23.
机译:本发明涉及一种用于制造来自绝缘体上的半导体衬底的微电子器件的方法,该方法包括形成在由绝缘槽分离的基板(10)的有源区中形成的有源元件(23),并由第一侧壁限定 (19B),由于绝缘沟槽至少部分地填充有第一电介质材料,因此该过程包括:在绝缘沟槽的第一底部化学蚀刻被动部分(21),以产生粗糙度的次级平均值是2 nm和6nm,这是无源部件形成(27)的步骤,在第一介电材料的顶部和无源部分(21)的突起处。抽象图:图23。

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