首页> 外国专利> SUBSTRATE COOLING UNIT, SUBSTRATE TREATMENT DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND PROGRAM

SUBSTRATE COOLING UNIT, SUBSTRATE TREATMENT DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND PROGRAM

机译:基板冷却单元,基板处理装置,制造半导体器件的方法,以及程序

摘要

Provided is a technology comprising: a substrate retention mechanism that retains a substrate horizontally; a drive unit that raises and lowers the substrate retention mechanism; a cooling plate that has a facing surface that faces a surface of the substrate; a laser emission unit that is disposed at one lateral end of a space in which the substrate rises and descends and that emits laser beams that are distributed so as to be wide in the direction in which the substrate retention mechanism is raised and lowered and are parallel to the surface of the substrate; a laser beam receiving unit, disposed at the other lateral end of the space, that acquires light receiving position identification information indicating positions at which the laser beams emitted from the laser emission unit are received in the direction in which the substrate retention mechanism is raised and lowered; and a calculation unit that, on the basis of the light receiving position identification information acquired by the laser beam receiving unit, calculates the distance between the cooling plate and the substrate.
机译:提供了一种技术,包括:基板保持机构,其水平地保持基板;驱动单元升高并降低基板保持机构;具有面对基板表面的面向表面的冷却板;一种激光发射单元,其设置在一个空间的一个横向端,其中基板上升和下降并且发射分布的激光束,以便在升高和降低的基板保持机构的方向上宽并且是平行的在基板的表面;设置在空间的另一个横向端部的激光束接收单元,其获取光接收位置识别信息,该光接收位置识别信息指示从激光发射单元发射的激光束的位置处于升高的方向上接收到升高的方向和降低;并且,计算单元,基于由激光束接收单元获取的光接收位置识别信息,计算冷却板和基板之间的距离。

著录项

  • 公开/公告号WO2021054157A1

    专利类型

  • 公开/公告日2021-03-25

    原文格式PDF

  • 申请/专利权人 KOKUSAI ELECTRIC CORPORATION;

    申请/专利号WO2020JP33693

  • 发明设计人 SAITO TAKUYA;TAKAHASHI AKIRA;HIYAMA SHIN;

    申请日2020-09-04

  • 分类号B65G49/07;H01L21/02;H01L21/324;H01L21/68;H01L21/683;C23C14/50;

  • 国家 JP

  • 入库时间 2024-06-14 21:23:25

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