首页> 外国专利> Semiconductor device comprising N-channel and P-channel transistors and production method

Semiconductor device comprising N-channel and P-channel transistors and production method

机译:包含n沟道和p沟道晶体管的半导体器件及其制造方法

摘要

A semiconductor device complementary circuit comprises an n-channel transistor (ON) using a two-dimensional electron gas (27) and a p-channel transistor (Qp) using a two-dimensional hole gas (28). The device comprises: a semi-insulating GaAs substrate (11); a channel layer (12) of i-type GaAs having n--type source and drain regions (18 and 19) and p+-type source and drain regions (20 and 21); a buffer layer (13) of i-type AlGaAs preventing carriers from passing through it; and, first and second control layers (14 and 15) of GaAs and/or AlGaAs having n-type or p-type conductivity. These layers are epitaxially formed in sequence on the substrate (11) by an MBE method or an MOCVD method. Metal electrodes (16, 17, 23 to 26) are formed on the first and second control layers (14 and 15), n+-type regions (18 and 19) and p"-type regions (20 and 21).
机译:半导体器件互补电路包括使用二维电子气(27)的n沟道晶体管(ON)和使用二维空穴气(28)的p沟道晶体管(Qp)。该装置包括:半绝缘的GaAs衬底(11);和具有n型源极和漏极区(18和19)和p +型源极和漏极区(20和21)的i型GaAs沟道层(12);防止载流子通过的i型AlGaAs缓冲层(13);以及具有n型或p型导电性的GaAs和/或AlGaAs的第一和第二控制层(14和15)。这些层通过MBE法或MOCVD法依次外延形成在基板(11)上。在第一和第二控制层(14和15),n +型区域(18和19)和p″型区域(20和21)上形成金属电极(16、17、23至26)。

著录项

  • 公开/公告号EP0165798A1

    专利类型

  • 公开/公告日1985-12-27

    原文格式PDF

  • 申请/专利权人 FUJITSU LIMITED;

    申请/专利号EP19850304320

  • 发明设计人 MIMURA TAKASHI;

    申请日1985-06-17

  • 分类号H01L27/08;H01L29/36;H01L29/80;

  • 国家 EP

  • 入库时间 2022-08-22 07:36:14

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号