首页> 外国专利> A memory cell array structure of a nonvolatile semiconductor memory device, a nonvolatile semiconductor memory device, the memory cell array access method of the apparatus, NAND flash memory device and semiconductor memory

A memory cell array structure of a nonvolatile semiconductor memory device, a nonvolatile semiconductor memory device, the memory cell array access method of the apparatus, NAND flash memory device and semiconductor memory

机译:非易失性半导体存储器件的存储单元阵列结构,非易失性半导体存储器件,装置的存储单元阵列访问方法,NAND闪存器件和半导体存储器

摘要

A non-volatile memory device has a main-memory cell array, and a sub-memory cell array, the latter consisting of a number of NAND-cell rows each consisting of a number of memory cell transistors where the number of memory cell transistors in the cell rows is less than the number of memory cell transistors in the NAND-rows of the main memory cell array. During programming and erasure, the sub-memory cell array is operatively joined to the main bit lines of the main-memory cell array, and has separate read-path independent of the that of the main-memory cell array. Independent claims are given for the following. (1) Memory cell array structure; (2) Electrically programmable non-volatile semiconductor memory device; (3) Method for accessing memory cell array; (4) NAND-flash memory device.
机译:非易失性存储器件具有主存储器单元阵列和子存储器单元阵列,子存储器单元阵列由多个NAND单元行组成,每个NAND单元行均由多个存储器单元晶体管组成,其中,单元行小于主​​存储单元阵列的NAND行中的存储单元晶体管的数量。在编程和擦除期间,子存储器单元阵列可操作地连接到主存储器单元阵列的主位线,并且具有独立于主存储器单元阵列的独立读取路径。以下是独立权利要求。 (1)存储器单元阵列结构; (2)电可编程非易失性半导体存储器件; (3)访问存储单元阵列的方法; (4)NAND闪存设备。

著录项

  • 公开/公告号JP4122151B2

    专利类型

  • 公开/公告日2008-07-23

    原文格式PDF

  • 申请/专利权人 三星電子株式会社;

    申请/专利号JP20010377728

  • 发明设计人 李 承 宰;林 瀛 湖;

    申请日2001-12-11

  • 分类号G11C16/04;G11C16/02;G11C16/06;

  • 国家 JP

  • 入库时间 2022-08-21 20:19:14

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