首页> 外国专利> Semiconductor Device and Method of Forming Vertical Interconnect Structure in Substrate for IPD and Baseband Circuit Separated by High-Resistivity Molding Compound

Semiconductor Device and Method of Forming Vertical Interconnect Structure in Substrate for IPD and Baseband Circuit Separated by High-Resistivity Molding Compound

机译:高电阻率模塑料分离的ipd和基带电路基板中形成垂直互连结构的半导体器件和方法

摘要

A semiconductor device is made with a conductive via formed through a top-side of the substrate. The conductive via extends vertically through less than a thickness of the substrate. An integrated passive device (IPD) is formed over the substrate. A plurality of first conductive pillars is formed over the first IPD. A first semiconductor die is mounted over the substrate. An encapsulant is formed around the first conductive pillars and first semiconductor die. A second IPD is formed over the encapsulant. An interconnect structure is formed over the second IPD. The interconnect structure operates as a heat sink. A portion of a back-side of the substrate is removed to expose the first conductive via. A second semiconductor die is mounted to the back-side of the substrate. The second semiconductor die is electrically connected to the first IPD and first semiconductor die through the conductive via.
机译:半导体器件由形成为贯穿衬底的顶侧的导电通孔制成。导电通孔垂直延伸穿过小于基板的厚度。集成无源器件(IPD)形成在基板上方。在第一IPD上方形成多个第一导电柱。第一半导体管芯安装在衬底上方。围绕第一导电柱和第一半导体管芯形成密封剂。在密封剂上方形成第二IPD。在第二IPD上方形成互连结构。互连结构用作散热器。去除衬底的背面的一部分以暴露第一导电通孔。将第二半导体管芯安装到基板的背面。第二半导体管芯通过导电通孔电连接到第一IPD和第一半导体管芯。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号