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An optimized process of high-performance integrated passive devices (IPDs) on SI-GaAs substrate for RF applications

机译:用于RF应用的SI-GaAs基板上的高性能集成无源器件(IPD)的优化工艺

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An integrated passive device (IPD) technology by semi-insulating (SI) GaAs-based fabrication has been developed to meet the ever increasing needs of size and cost reduction for RF and microwave applications. In this paper, we develop an advanced optimized process for realizing IPDs to reduce fabrication time and total cost and to increase RF performances. The critical characteristics of lumped elements thin film resistor (TFR), spiral inductor and metal-insulator-metal (MIM) capacitor are optimized in this advanced process. A low-pass filter (LPF) for global system for mobile communications (GSM) is demonstrated by using this IPD process; it shows very good RF performances in spite of its small chip size and low cost, when compared with the recently reported literature.
机译:已经开发了一种通过半绝缘(Si)GaAs制造的集成无源装置(IPD)技术,以满足RF和微波应用的尺寸和成本降低的不断增加的需求。在本文中,我们开发了一个先进的优化过程,实现IPD,以降低制造时间和总成本,并增加RF性能。在该高级工艺中优化了集体元件薄膜电阻(TFR),螺旋电感器和金属 - 绝缘体 - 金属(MIM)电容的临界特性。通过使用本IPD进程,对全球移动通信系统(GSM)进行低通滤波器(LPF);尽管其与最近报道的文献相比,它表明,尽管其芯片尺寸小和成本低,但仍显示出非常好的RF性能。

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