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MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE CAPABLE OF SECURING A BOTTOM LINE WIDTH NECESSARY FOR AN OPEN AREA

机译:能够在开阔区域内确保底线宽度的半导体装置的制造方法

摘要

PURPOSE: A manufacturing method of a semiconductor device capable of securing a bottom line width necessary for an open area is provided to secure bottom line width in the semiconductor device by forming an etch stopping layer equipping a first pattern.;CONSTITUTION: A manufacturing method of a semiconductor device capable of securing a bottom line width necessary for an open area is as follows. An etching stopping layer(54) equipping a first pattern extending an upper side of the insulating layer is formed on an insulating layer. The insulating layer is formed on the etching stopping layer. The second pattern exposes the upper side of the conductive film and selectively etches the insulating layer.;COPYRIGHT KIPO 2010
机译:目的:提供一种能够确保开口区域所需的底线宽度的半导体器件的制造方法,以通过形成装备有第一图案的蚀刻停止层来确保半导体器件中的底线宽度。能够确保开口区域所需的底线宽度的半导体装置如下。在绝缘层上形成刻蚀停止层(54),该刻蚀停止层(54)配备有延伸到绝缘层的上侧的第一图案。在蚀刻停止层上形成绝缘层。第二个图案露出导电膜的上侧并选择性地蚀刻绝缘层。; COPYRIGHT KIPO 2010

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