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SEMICONDUCTOR DEVICE AND A MANUFACTURING METHOD THEREOF CAPABLE OF SECURING PROCESS MARGIN BETWEEN BOTTOM ELECTRODES

机译:能够处理底部电极之间的工艺裕度的半导体装置及其制造方法

摘要

PURPOSE: A semiconductor device and a manufacturing method thereof are provided to prevent a bridge fail by differently forming the height of a bowing profile between adjacent bottom electrodes.;CONSTITUTION: A first storage electrode contact plug(137) is formed on the upper side of a semiconductor substrate. The height of a second storage electrode contact plug(138) is different from the height of the first storage contact plug. A bottom electrode is formed on the upper sides of the first storage electrode contact plug and the second storage electrode contact plug. The first storage electrode contact plug and the second storage electrode contact plug respectively have polysilicon. The first storage electrode contact plug and the second storage electrode contact plug are alternatively arranged.;COPYRIGHT KIPO 2012
机译:目的:提供一种半导体器件及其制造方法,以通过不同地形成相邻底部电极之间的弓形轮廓的高度来防止桥接失败;组成:第一存储电极接触塞(137)形成在半导体器件的上侧半导体衬底。第二存储电极接触塞(138)的高度与第一存储电极接触塞的高度不同。底部电极形成在第一存储电极接触塞和第二存储电极接触塞的上侧。第一存储电极接触塞和第二存储电极接触塞分别具有多晶硅。第一存储电极接触塞和第二存储电极接触塞交替排列。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120080890A

    专利类型

  • 公开/公告日2012-07-18

    原文格式PDF

  • 申请/专利权人 SK HYNIX INC.;

    申请/专利号KR20110002353

  • 发明设计人 SOHN SANG HO;

    申请日2011-01-10

  • 分类号H01L21/8242;H01L27/108;

  • 国家 KR

  • 入库时间 2022-08-21 17:09:33

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