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NMOS device, PMOS device, and SiGe HBT device formed on SOI substrate and method of fabricating the same

机译:在SOI衬底上形成的NMOS器件,PMOS器件和SiGe HBT器件及其制造方法

摘要

Provided are an NMOS device, a PMOS device and a SiGe HBT device which are implemented on an SOI substrate and a method of fabricating the same. In manufacturing a Si-based high speed device, a SiGe HBT and a CMOS are mounted on a single SOI substrate. In particular, a source and a drain of the CMOS are formed of SiGe and metal, and thus leakage current is prevented and low power consumption is achieved. Also, heat generation in a chip is suppressed, and a wide operation range may be obtained even at a low voltage.
机译:提供在SOI衬底上实现的NMOS器件,PMOS器件和SiGe HBT器件及其制造方法。在制造基于Si的高速器件时,将SiGe HBT和CMOS安装在单个SOI衬底上。特别地,CMOS的源极和漏极由SiGe和金属形成,因此防止了泄漏电流并且实现了低功耗。而且,抑制了芯片中的发热,并且即使在低电压下也可以获得宽的工作范围。

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