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SEMICONDUCTOR DEVICE AND A METHOD FOR FORMING THE SAME CAPABLE OF REDUCING PARASITIC CAPACITANCE

机译:半导体装置和用于形成减小寄生电容的相同能力的方法

摘要

PURPOSE: A semiconductor device and a method for forming the same are provided to constantly secure the height of a buried type gate in a cell region to be the same as the height of a gate in a peripheral region by forming a stepped part between the cell region and the peripheral region.;CONSTITUTION: Element isolation films(120, 220) defining active regions(110, 210) are formed on a semiconductor substrate. A hard mask layer is formed on the surface of the semiconductor substrate. A hard mask pattern(132) is formed by etching the peripheral circuit region part of the hard mask layer. The semiconductor substrate on the peripheral circuit region part is etched using the hard mask pattern as a mask in order to form a stepped part between a cell region and a peripheral region.;COPYRIGHT KIPO 2011
机译:目的:提供一种半导体器件及其形成方法,以通过在单元之间形成阶梯状部分来将单元区域中的掩埋型栅极的高度恒定地确保与外围区域中的栅极的高度相同。组成:构成有源区(110、210)的元件隔离膜(120、220)形成在半导体衬底上。在半导体衬底的表面上形成硬掩模层。通过蚀刻硬掩模层的外围电路区域部分来形成硬掩模图案(132)。使用硬掩模图案作为掩模蚀刻外围电路区域部分上的半导体衬底,以便在单元区域和外围区域之间形成台阶部分。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110064962A

    专利类型

  • 公开/公告日2011-06-15

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090121764

  • 发明设计人 PARK JEONG HOON;KIM DONG SAUK;

    申请日2009-12-09

  • 分类号H01L27/108;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:42

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