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首页> 外文期刊>IEEE transactions on nanotechnology >Modeling and Performance Comparison of 1-D and 2-D Devices Including Parasitic Gate Capacitance and Screening Effect
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Modeling and Performance Comparison of 1-D and 2-D Devices Including Parasitic Gate Capacitance and Screening Effect

机译:一维和二维器件的建模和性能比较,包括寄生栅极电容和屏蔽效应

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摘要

Devices based on nanotubes and nanowires have been a popular research topic in the recent years. Many groups have shown promising experimental results in this area. In this paper, we examine the expected performances of 1-D and 2-D MOSFETs by numerical simulation and analytical models. We show that 1-D devices are not necessarily better than 2-D devices for future technologies, especially for low-channel densities and narrow gate widths, due to the parasitic capacitances and screening of the adjacent channels. For example, the delay improvement is overestimated from the intrinsic cases by at least 30%-60% from ignoring parasitics and channel screening effects, for Wgate<10 Lg and channel densities from 400 to 25 mum. We propose a methodology for 1-D device design optimization, and a possible scaling path of 1-D devices down to 11 nm node. The analytical model is a first step toward a compact model for 1-D FETs.
机译:近年来,基于纳米管和纳米线的器件已成为热门的研究主题。许多小组在该领域显示出令人鼓舞的实验结果。在本文中,我们通过数值模拟和分析模型来检验1-D和2-D MOSFET的预期性能。我们显示,由于寄生电容和相邻通道的屏蔽,对于未来的技术,尤其是对于低通道密度和窄栅极宽度而言,一维器件不一定优于二维器件。例如,对于Wgate <10 Lg和通道密度从400到25μm的情况,由于忽略了寄生效应和通道屏蔽效应,与固有情况相比,延迟改善被高估了至少30%-60%。我们提出了一种用于一维设备设计优化的方法,以及一维设备到11纳米节点的可能的缩放路径。分析模型是迈向一维FET紧凑模型的第一步。

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