首页> 外国专利> WAFER LEVEL PACKAGING STRUCTURE FOR IMAGE SENSORS AND WAFER LEVEL PACKAGING METHOD FOR IMAGE SENSORS

WAFER LEVEL PACKAGING STRUCTURE FOR IMAGE SENSORS AND WAFER LEVEL PACKAGING METHOD FOR IMAGE SENSORS

机译:图像传感器的晶圆级包装结构和图像传感器的晶圆级包装方法

摘要

A wafer level packaging structure for image sensors and a wafer level packaging method for image sensors are provided. The wafer level packaging structure includes: a wafer to be packaged including multiple chip regions and scribe line regions between the chip regions; pads and image sensing regions located on a first surface of the wafer and located in the chip regions; first dike structures covering surfaces of the pads and the scribe line regions; a packaging cover arranged facing the first surface of the wafer; and second dike structures located on a surface of the packaging cover. The second dike structures are arranged corresponding to the scribe line regions. The packaging cover and the wafer are jointed fixedly via the second dike structures and the first dike structures.
机译:提供了用于图像传感器的晶片级封装结构和用于图像传感器的晶片级封装方法。晶片级封装结构包括:待封装的晶片,其包括多个芯片区域和芯片区域之间的划线区域;位于晶片的第一表面上并位于芯片区域中的焊盘和图像感测区域;第一堤坝结构,其覆盖焊盘和划线区域的表面;面对晶片的第一表面布置的包装盖;第二堤防结构位于包装盖的表面上。第二堤防结构对应于划线区域布置。封装盖与晶圆通过第二堤坝结构与第一堤坝结构固定连接。

著录项

  • 公开/公告号US2015054109A1

    专利类型

  • 公开/公告日2015-02-26

    原文格式PDF

  • 申请/专利权人 CHINA WAFER LEVEL CSP CO. LTD.;

    申请/专利号US201414450153

  • 发明设计人 WEI WANG;ZHIQI WANG;QIONG YU;

    申请日2014-08-01

  • 分类号H01L31/0203;H01L31/18;

  • 国家 US

  • 入库时间 2022-08-21 15:23:07

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