首页> 外国专利> IMPRINT LITHOGRAPHY METHOD, MANUFACTURING METHOD OF MASTER TEMPLATE FOR IMPRINT LITHOGRAPHY USING SAME, AND MASTER TEMPLATE FOR IMPRINT LITHOGRAPHY MANUFACTURED BY SAME

IMPRINT LITHOGRAPHY METHOD, MANUFACTURING METHOD OF MASTER TEMPLATE FOR IMPRINT LITHOGRAPHY USING SAME, AND MASTER TEMPLATE FOR IMPRINT LITHOGRAPHY MANUFACTURED BY SAME

机译:印刷平版印刷方法,使用相同的印刷版主模板的制造方法以及使用相同的印刷平版印刷的主模板

摘要

An imprint lithography method includes: a step of forming a mask layer in a first area and a second area in contact with the first area on a base substrate; a step of reducing the thickness of the mask layer in the first area; a step of forming a first flattening layer in the first and second areas on the mask layer; a step of forming a first imprint pattern on the first flattening layer; a step of etching the first flattening layer partially with the first imprint pattern as an etching wall and forming a first flattening layer-pattern; a step of etching the mask layer partially with the first flattening layer-pattern as an etching wall and forming a first mask pattern in the first area; a step of forming a second flattening layer in the first mask pattern and the first and the second area on the mask layer; a step of forming a second imprint pattern on the second flattening layer; a step of etching the second flattening layer partially with the second imprint pattern as an etching wall and forming a second flattening layer-pattern; and a step of etching the mask layer partially with the second flattening layer-pattern as an etching wall and forming a second mask pattern in the second area.;COPYRIGHT KIPO 2016
机译:压印光刻方法包括:在基底基板上的第一区域和与第一区域接触的第二区域中形成掩模层的步骤;减小第一区域中的掩模层的厚度的步骤;在掩模层上的第一和第二区域中形成第一平坦化层的步骤;在第一平坦化层上形成第一压印图案的步骤;步骤,以所述第一压印图案为蚀刻壁,对所述第一平坦化层进行部分蚀刻,形成第一平坦化层图案。步骤,以所述第一平坦化层图案作为蚀刻壁,对所述掩模层进行部分蚀刻,并在所述第一区域形成第一掩模图案。在第一掩模图案以及掩模层上的第一和第二区域中形成第二平坦化层的步骤;在第二平坦化层上形成第二压印图案的步骤;步骤,以所述第二压印图案为蚀刻壁对所述第二平坦层进行部分蚀刻,形成第二平坦层图案。以及以第二平坦化层图案作为蚀刻壁部分蚀刻掩模层并在第二区域中形成第二掩模图案的步骤。COPYRIGHTKIPO 2016

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