首页> 外国专利> IMPRINT LITHOGRAPHY METHOD, METHOD FOR MANUFACTURING MASTER TEMPLATE FOR IMPRINT LITHOGRAPHY USING SAME, AND MASTER TEMPLATE FOR IMPRINT LITHOGRAPHY MANUFACTURED THEREBY

IMPRINT LITHOGRAPHY METHOD, METHOD FOR MANUFACTURING MASTER TEMPLATE FOR IMPRINT LITHOGRAPHY USING SAME, AND MASTER TEMPLATE FOR IMPRINT LITHOGRAPHY MANUFACTURED THEREBY

机译:印刷平版印刷术方法,使用相同方法制造印刷平版印刷术的主模板的方法以及由此制造的印刷平版印刷术的主模板

摘要

An imprint lithography method comprises the steps of: forming a first imprint pattern in a first area on a base substrate; forming a first resist pattern in a second area partially overlapping the first area on the base substrate; etching a lower portion of the first imprint pattern inside a third area which is a part of the first area not overlapping the second area by using the first imprint pattern and the first resist pattern as an etch barrier; removing the remaining first imprint pattern and the first resist pattern; forming a second imprint pattern in a fourth area partially overlapping the third area and overlapping the second area on the base substrate; forming a second resist pattern in the third area on the base substrate; and etching a lower portion of the second imprint pattern in the second area by using the second imprint pattern and the second resist pattern as an etch barrier.;COPYRIGHT KIPO 2017
机译:一种压印光刻方法,包括以下步骤:在基础基板上的第一区域中形成第一压印图案;在与基底基板上的第一区域部分重叠的第二区域中形成第一抗蚀剂图案;通过使用第一压印图案和第一抗蚀剂图案作为蚀刻阻挡层,在第一区域的一部分不与第二区域重叠的第三区域内蚀刻第一压印图案的下部;去除剩余的第一压印图案和第一抗蚀剂图案;在与基底基板部分地与第三区域重叠并且与第二区域重叠的第四区域中形成第二压印图案;在基础基板上的第三区域中形成第二抗蚀剂图案;通过使用第二压印图案和第二抗蚀剂图案作为蚀刻阻挡层在第二区域中蚀刻第二压印图案的下部。; COPYRIGHT KIPO 2017

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