A semiconductor device includes: a plurality of transistor mismatch circuits (104, 202) formed on a semiconductor wafer (101); And a characterizing circuit 206 formed on the semiconductor wafer. The characterizing circuit 202 is connected to receive simultaneously the inputs provided by the transistor mismatching circuits that simultaneously receive inputs from the mismatching circuits, and between the transistors 208/212, 210/214 in the mismatching circuits And outputs the standard deviation of the mismatch of the mismatch.
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