首页> 外国专利> Field effect transistor (FET) with a gate having a recessed work function metal layer and method of forming the FET

Field effect transistor (FET) with a gate having a recessed work function metal layer and method of forming the FET

机译:具有具有凹陷的功函数金属层的栅极的场效应晶体管(FET)及其形成方法

摘要

Disclosed is a field effect transistor (FET) with a replacement metal gate (RMG) and a method of forming the FET. The RMG includes a conformal gate dielectric layer and a stack of gate conductor layers on the gate dielectric layer. The stack includes a conformal work function metal (WFM) layer and a conductive fill material (CFM) layer on the WFM layer. Within the stack, the top surface of the CFM layer is above the level of the top of an adjacent vertical portion of the WFM layer. A dielectric gate cap has a center portion and an edge portion. The center portion is above the top surface of the CFM layer and the edge portion is above the top of the adjacent vertical portion of the WFM layer and is further positioned laterally immediately adjacent to an upper portion of an outer sidewall of the CFM layer.
机译:公开了一种具有替代金属栅极(RMG)的场效应晶体管(FET)及其形成方法。 RMG包括保形栅极电介质层和在栅极电介质层上的栅极导体层的堆叠。堆叠包括保形功函数金属(WFM)层和WFM层上的导电填充材料(CFM)层。在堆叠内,CFM层的顶面位于WFM层的相邻垂直部分顶部的高度之上。介电栅极盖具有中心部分和边缘部分。中心部分在CFM层的顶表面上方,并且边缘部分在WFM层的相邻垂直部分的顶部上方,并且进一步在横向上紧邻CFM层的外侧壁的上部定位。

著录项

  • 公开/公告号US10217839B2

    专利类型

  • 公开/公告日2019-02-26

    原文格式PDF

  • 申请/专利权人 GLOBALFOUNDRIES INC.;

    申请/专利号US201715468170

  • 申请日2017-03-24

  • 分类号H01L29/423;H01L29/66;H01L29/49;H01L29/417;H01L21/3105;H01L21/3213;H01L21/768;H01L21/28;

  • 国家 US

  • 入库时间 2022-08-21 12:10:43

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