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METHOD FOR FABRICATING POLYSILICON TFT SUBSTRATE AND POLYSILICON TFT SUBSTRATE

机译:制造多晶硅TFT基板的方法和多晶硅TFT基板

摘要

A method for fabricating a polysilicon TFT substrate comprises: step S10, depositing an amorphous silicon film layer on a base substrate (10); step S11, performing excimer laser annealing on the amorphous silicon film layer to form a polysilicon active layer (13); step S12, ion doping a channel region of the polysilicon active layer (13) to form a channel doping region (130); step S13, performing deposition on the polysilicon active layer (13) to form a gate insulating layer (14); step S14, performing hydrogen ion implantation into the channel doping region (130) of the polysilicon active layer; step S15, performing deposition on the gate insulating layer (14) to form a gate layer (15); step S16, ion doping a source region and a drain region of the polysilicon active layer (13) to form a source doping region (131) and a drain doping region (132); step S17, performing deposition on the gate layer (15) to form an interlayer insulating layer (16); step S18, forming a first via hole (160) and a second via hole (161) on the interlayer insulating layer (16), and performing deposition to respectively form a source electrode film layer (162) and a drain electrode film layer (163) for electrical connection to the source doping region (131) and the drain doping region (132), respectively. A corresponding polysilicon TFT substrate is also disclosed. The invention can accurately control the concentration and depth of the added hydrogen atoms and improve TFT yield.
机译:制造多晶硅TFT基板的方法包括:步骤S10,在基础基板(10)上沉积非晶硅膜层;步骤S11,对非晶硅膜层进行准分子激光退火,形成多晶硅活性层(13)。步骤S12,对多晶硅有源层(13)的沟道区进行离子掺杂,形成沟道掺杂区(130)。步骤S13,在多晶硅有源层(13)上进行沉积,形成栅绝缘层(14);步骤S14,将氢离子注入到多晶硅有源层的沟道掺杂区(130)中;步骤S15,在栅极绝缘层(14)上进行沉积,形成栅极层(15)。步骤S16,对多晶硅有源层(13)的源区和漏区进行离子掺杂,形成源掺杂区(131)和漏掺杂区(132)。步骤S17,在栅极层(15)上进行沉积,形成层间绝缘层(16);步骤S18,在层间绝缘层(16)上形成第一通孔(160)和第二通孔(161),并进行沉积以分别形成源电极膜层(162)和漏电极膜层(163) )分别用于电连接到源极掺杂区(131)和漏极掺杂区(132)。还公开了相应的多晶硅TFT基板。本发明可以精确控制加入的氢原子的浓度和深度,提高TFT的产量。

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