首页> 外国专利> SUBSTRATE POSITION COMPENSATING APPARATUS, SUBSTRATE POSITION COMPENSATING METHOD, SUBSTRATE PROCESSING APPARATUS HAVING SAME, AND SUBSTRATE PROCESSING METHOD HAVING SAME

SUBSTRATE POSITION COMPENSATING APPARATUS, SUBSTRATE POSITION COMPENSATING METHOD, SUBSTRATE PROCESSING APPARATUS HAVING SAME, AND SUBSTRATE PROCESSING METHOD HAVING SAME

机译:基板位置补偿装置,基板位置补偿方法,具有相同功能的基板处理装置以及具有相同功能的基板处理方法

摘要

According to exemplary embodiments of the present invention, a substrate position compensating apparatus, a substrate position compensating method, a substrate processing apparatus having the same, and a substrate processing method having the same can compensate for and identify a position on which a substrate is mounted through contact with the substrate when processing the substrate. Likewise, the present invention is possible to perform more exact position compensation because of being possible to identify the position on which the substrate is mounted through the contact with the substrate and is possible to sufficiently shorten process time because of being possible to automatically compensate for the position in accordance with a predetermined qualification.;COPYRIGHT KIPO 2019
机译:根据本发明的示例性实施例,基板位置补偿设备,基板位置补偿方法,具有该基板位置补偿方法的基板处理设备以及具有该基板位置补偿方法的基板处理方法可以补偿并识别安装基板的位置。通过在处理基板时与基板接触。同样,由于可以通过与基板的接触来识别基板的安装位置,并且可以自动地补偿基板的位置,因此本发明可以进行更精确的位置补偿。职位符合预定资格。; COPYRIGHT KIPO 2019

著录项

  • 公开/公告号KR20190062915A

    专利类型

  • 公开/公告日2019-06-07

    原文格式PDF

  • 申请/专利权人 SEMES CO. LTD.;

    申请/专利号KR20170161589

  • 发明设计人 CHA EUNG JAE;KIM SUNG UN;YUN YOUNG UN;

    申请日2017-11-29

  • 分类号H01L21/67;H01L21/02;H01L21/677;

  • 国家 KR

  • 入库时间 2022-08-21 11:50:45

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