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APPARATUS AND METHODS FOR DRY ETCH WITH EDGE SIDE AND BACK PROTECTION

机译:具有边缘侧和背面保护的干蚀刻的装置和方法

摘要

Embodiments of the present invention generally relate to a method and apparatus for plasma etching substrates, and more particularly, to a method and apparatus having protection for edges, sides and back surfaces of substrates being processed. Embodiments of the present invention provide an edge protection plate having an aperture smaller in size than the substrate being processed, where the edge protection plate can be located very close to the substrate in the plasma chamber. The edge protection plate overlaps the edges and / or sides of the substrate to provide protection for the edges, sides, and reflective coatings on the back side of the substrate.
机译:技术领域本发明的实施例总体上涉及用于等离子体蚀刻衬底的方法和设备,并且更具体地,涉及对正在处理的衬底的边缘,侧面和背面具有保护的方法和设备。本发明的实施例提供一种边缘保护板,该边缘保护板的孔径小于被处理的基板的尺寸,其中该边缘保护板可以位于等离子体室中非常靠近基板的位置。边缘保护板与基板的边缘和/或侧面重叠,以保护基板背面的边缘,侧面和反射涂层。

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