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Towards Mapping Electrostatic Potentials in Semiconductor Devices Under Working Conditions Using Off-Axis Electron Holography

机译：利用离轴电子全息术在工作条件下绘制半导体器件中的静电势

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Yazdi Sadegh; Kasama Takeshi; McComb D. W.; Harrison A. C.; Dunin-Borkowski Rafal E.;
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年度 2013
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正文语种 eng
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1. Towards quantitative electrostatic potential mapping of working semiconductor devices using off-axis electron holography [J] . Yazdi Sadegh, Kasama Takeshi, Beleggia Marco, Ultramicroscopy . 2015,第Null期

机译：使用离轴电子全息技术对工作半导体器件进行定量静电势测绘
2. Off-axis electron holography of electrostatic potentials in unbiased and reverse biased focused ion beam milled semiconductor devices. [J] . Twitchett AC, Dunin Borkowski RE, Hallifax RJ, Journal of Microscopy . 2004,第Pta3期

机译：偏电和反向偏置聚焦离子束铣削半导体器件中静电势的离轴电子全息图。
3. Off-axis electron holography with a dual-lens imaging system and its usefulness in 2-D potential mapping of semiconductor devices [J] . Y.Y. Wang, M. Kawasaki, J. Bruley Ultramicroscopy . 2004,第2a4期

机译：具有双透镜成像系统的离轴电子全息图及其在半导体器件二维电势映射中的实用性
4. Field mapping of semiconductor devices in a transmission electron microscope with nanometre scale resolution by off-axis electron holography and precession electron diffraction [C] . David Cooper, Nicolas Bernier, Jean-Luc Rouviere IEEE International Conference on Nanotechnology . 2015

机译：离轴电子全息和进动电子衍射在纳米尺度分辨率的透射电子显微镜中半导体器件的场图
5. Characterization of electrostatic potential of semiconductor devices using off-axis electron holography. [D] . Han, Myung-Geun. 2007

机译：使用离轴电子全息图表征半导体器件的静电势。
6. Determination of the electrostatic potential distribution in Pt/Fe:SrTiO3/Nb:SrTiO3 thin-film structures by electron holography [O] . Astrid Marchewka, David Cooper, Christian Lenser, -1

机译：电子全息法测定Pt / Fe：SrTiO3 / Nb：SrTiO3薄膜结构中的静电势分布
7. Towards quantitative electrostatic potential mapping of working semiconductor devices using off-axis electron holography [O] . Yazdi, Sadegh, Kasama, Takeshi, Beleggia, Marco, 2015

机译：使用离轴电子全息技术对工作半导体器件进行定量静电势测绘
8. The Electrostatic Potential Inside a Hemisphere: Its Use as an Electron Energy Analyzer and as a Triode Electronic Device. [R] . frederickson, a. r. jasperse, j. r. 1971

机译：半球内部的静电势：用作电子能量分析仪和三极管电子设备。

Towards Mapping Electrostatic Potentials in Semiconductor Devices Under Working Conditions Using Off-Axis Electron Holography

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