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Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction

机译：基于同步加速器的X射线衍射测定In（2）O（3）的（001）和（111）取向薄膜的泊松比

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Zhang K H L; Regoutz A; Palgrave R G; Payne D J; Egdell R G; Walsh Aron; Collins S P; Wermeille D; Cowley R A;
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年度 2011
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1. Determination of the Poisson ratio of (001) and (111) oriented thin films of In_2O_3 by synchrotron-based x-ray diffraction [J] . K. H. L. Zhang, A. Regoutz, R. G. Palgrave, Physical review . 2011,第23期

机译：基于同步加速器的x射线衍射法测定In_2O_3的（001）和（111）取向薄膜的泊松比
2. A study of (111) oriented epitaxial thin films of In_2O_3 on cubic Y-doped ZrO_2 by synchrotron-based x-ray diffraction [J] . Anna Regoutz, Kelvin H.L. Zhang, Russell G. Egdell, Journal of Materials Research . 2012,第17期

机译：基于同步加速器的x射线衍射研究立方Y掺杂ZrO_2上In_2O_3的（111）取向外延薄膜
3. Determination of Young's modulus and Poisson's ratio of thin films by combining sin~2ψ X-ray diffraction and laser curvature methods [J] . Jeh-Yin Chang, Ge-Ping Yu, Jia-Hong Huang Thin Solid Films . 2009,第24期

机译：结合sin〜2ψX射线衍射和激光曲率法测定薄膜的杨氏模量和泊松比
4. Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction [C] . A. Koblischka-Veneva, M. R. Koblischka, S. Murphy Annual Conference on Magnetism and Magnetic Materials . 2008

机译：通过电子 - 反向散射衍射研究的MgO基板的（001）和（111）取向的微型薄膜
5. Growth and structure of ultra-thin epitaxial chromium and iron oxide films on silver(001) and silver(111): A comprehensive study accomplished by x-ray photoelectron diffraction and low energy electron diffraction. [D] . Ozturk, Osman. 2002

机译：银（001）和银（111）上超薄外延铬和氧化铁膜的生长和结构：通过X射线光电子衍射和低能电子衍射完成的综合研究。
6. Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films [O] . Roland Resel, Markus Bainschab, Alexander Pichler, -1

机译：掠入射X射线衍射中的多次散射：对薄膜中晶格常数测定的影响
7. Determination of the Poisson ratio of (001) and (111) oriented thin films of In2O3 by synchrotron-based x-ray diffraction [O] . Zhang, KHL, Regoutz, A, Palgrave, RG, 2011

机译：基于同步加速器的X射线衍射测定In2O3（001）和（111）取向薄膜的泊松比

Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction

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