首页> 美国政府科技报告 >BMDO-AASERT: Group III Nitride Semiconductor Nanostructure Research MOCVD Growth and Novel Characterizations of High Temperature, High Carrier Density and Microcrack Lasing Effects
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BMDO-AASERT: Group III Nitride Semiconductor Nanostructure Research MOCVD Growth and Novel Characterizations of High Temperature, High Carrier Density and Microcrack Lasing Effects

机译:BmDO-aasERT:III族氮化物半导体纳米结构研究mOCVD生长和高温,高载流子密度和微裂纹激光效应的新特征

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This project provided training for graduate students in a wide variety of areas related to III-nitride research: epitaxial growth using MOCVD and MBE, optical and electrical characterization, post-growth processing and device fabrication. This training program was unique in that it exposed students to nearly all aspects of critical III-nitride technology through this comprehensive training.

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