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AlGaN/GaN HEMT's photoresponse to high intensity THz radiation

机译:AlGaN / GaN HEMT对高强度太赫兹辐射的光响应

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We report on the photoresponse dependence on the terahertz radiation intensity in ALGaN/GaN HEMTs. We show that the ALGaN/GaN HEMT can be used as a THz detector in CW and in pulsed regime up to radiation intensity of several kW/cm(2). The dynamic range in the pulsed regime of detection can be more than 2 decades. We observed that the photoresponse of the HEMT could have a compound composition if two independent parts of the transistor are involved in the detection process; this result indicates that a more simple one channel device may be preferable on the detection purpose.
机译:我们报告了在ALGaN / GaN HEMT中光响应对太赫兹辐射强度的依赖性。我们表明,ALGaN / GaN HEMT可用作连续波中的THz检测器,并且在高达几kW / cm(2)的辐射强度的脉冲状态下均可用作。脉冲检测方式中的动态范围可能超过2年。我们观察到,如果晶体管的两个独立部分参与检测过程,则HEMT的光响应可能具有复合成分。该结果表明,就检测目的而言,更简单的单通道设备可能是可取的。

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