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首页> 外文期刊>Soldering & Surface Mount Technology >Thermal fatigue endurance of Sn3Ag0.5Cu0.5In0.05Ni and Sn2.5Ag0.8Cu0.5Sb solders in composite solder joints of LTCC/PWB assemblies
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Thermal fatigue endurance of Sn3Ag0.5Cu0.5In0.05Ni and Sn2.5Ag0.8Cu0.5Sb solders in composite solder joints of LTCC/PWB assemblies

机译:LTCC / PWB组件的复合焊点中的Sn3Ag0.5Cu0.5In0.05Ni和Sn2.5Ag0.8Cu0.5Sb焊料的热疲劳耐久性

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摘要

Purpose - The purpose of this paper is to investigate the thermal fatigue endurance of two lead-free solders used in composite solder joints consisting of plastic core solder balls (PCSB) and different solder materials, in order to assess their feasibility in low-temperature cofired ceramic (LTCC)/printed wiring board (PWB) assemblies. Design/methodology/approach - The characteristic lifetime of these joints was determined in a thermal cycling test (TCT) over a temperature range of -40-125℃. Their failure mechanisms were analyzed after the TCT using scanning acoustic and optical microscopy, scanning electronic microscope, and field emission scanning electronic microscope investigation. Findings - The results showed that four different failure mechanisms existed in the test assemblies cracking in the mixed ceramic/metallization zone; or a mixed transgranular/intergranular failure occurred at the low temperature extreme; whereas an intergranular failure within the solder matrix; or separation of the intermetallic layer and the solder matrix occurred at the high temperature extreme. Sn3Ag0.5Cu0.5In0.05Ni was more resistant to mixed transgranular/intergranular failure, but had poor adhesion with the Ag3Sn layer. On the other hand, cracking in the mixed ceramic/metallization zone typically existed in the joints with Sn2.5Ag0.8Cu0.5Sb solder, whereas the joints with Sn3Ag0.5Cu0.5In0.05Ni were practically free of these cracks. The characteristic lifetimes of both test joint configurations were at the same level (800-1,000) compared with joints consisted of Sn4Ag0.5Cu solder and PCSB studied earlier. Originality/value - The study investigated in detail the failure mechanisms of the Sn3Ag0.5Cu0.5In0.05Ni and Sn2.5Ag0.8Cu0.5Sb solders under harsh accelerated test conditions. It was proved that these solders behaved similarly to the ternary SnAgCu solders in these conditions and no improvement can be achieved by utilizing these solders in the non-collpasible solder joints of LTCC/PWB assemblies.
机译:目的-本文的目的是研究两种由塑料芯焊球(PCSB)和不同焊锡材料组成的复合焊点中使用的两种无铅焊料的耐热疲劳性,以评估其在低温共烧下的可行性陶瓷(LTCC)/印刷线路板(PWB)组件。设计/方法/方法-这些接头的特征寿命是在-40-125℃的温度范围内的热循环测试(TCT)中确定的。在TCT之后,使用扫描声学和光学显微镜,扫描电子显微镜和场发射扫描电子显微镜对它们的失效机理进行了分析。研究结果-结果表明,在混合陶瓷/金属化区域的裂纹中,测试组件存在四种不同的破坏机制;或在低温极端条件下发生了跨晶/晶间混合破坏;而焊料基质内的晶间破坏;金属间层与焊料基体的分离或分离发生在高温极限下。 Sn3Ag0.5Cu0.5In0.05Ni对跨晶/晶间混合破坏具有更高的抵抗力,但与Ag3Sn层的附着力较差。另一方面,Sn2.5Ag0.8Cu0.5Sb焊料的接合处通常存在混合陶瓷/金属化区域中的裂纹,而Sn3Ag0.5Cu0.5In0.05Ni的接合处实际上没有这些裂纹。与先前研究的由Sn4Ag0.5Cu焊料和PCSB组成的接头相比,两种测试接头构造的特征寿命都处于相同水平(800-1,000)。原创性/价值-该研究详细研究了在苛刻的加速测试条件下Sn3Ag0.5Cu0.5In0.05Ni和Sn2.5Ag0.8Cu0.5Sb焊料的失效机理。事实证明,在这些条件下,这些焊料的性能与三元SnAgCu焊料相似,并且在LTCC / PWB组件的不可塌陷焊点中使用这些焊料无法实现任何改善。

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