首页> 外文期刊>Journal of Electronic Materials >Metallurgical Reactions in Composite 90Pb10Sn/Lead-Free Solder Joints and Their Effect on Reliability of LTCC/PWB Assembly
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Metallurgical Reactions in Composite 90Pb10Sn/Lead-Free Solder Joints and Their Effect on Reliability of LTCC/PWB Assembly

机译:90Pb10Sn /无铅复合焊点中的冶金反应及其对LTCC / PWB组件可靠性的影响

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摘要

Use of 90Pb10Sn solder as a noncollapsible sphere material with 95.5Sn 4Ag0.5Cu and SnInAgCu lead-free solders is investigated.Practical reflow conditions led to strong Pb dissolution into liquid solder,resulting in >20 at.% Pb content in the original lead-free solders.The failure mechanism of the test joints is solder cracking due to thermal fatigue,but the characteristic lifetime of 90Pb10Sn/SnInAgCu joints is almost double that of 90Pb10Sn/ 95.5Sn4Ag0.5Cu in a thermal cycling test (TCT) over the temperature range from -40 deg C to 125 deg C.It is predicted that this is mainly a consequence of the better fatigue resistance of the SnPbInAgCu alloy compared with the SnPbAgCu alloy.Indium accelerates the growth of the intermetallic compound (IMC) layer at the low temperature co-fired ceramic (LTCC) metallization/solder interface and causes coarsening of IMC particles during the TCT,but these phenomena do not have a major effect on the creep/fatigue endurance of the test joints.
机译:研究了将90Pb10Sn焊料与95.5Sn 4Ag0.5Cu和SnInAgCu无铅焊料用作不可塌陷的球形材料。实际的回流条件导致Pb大量溶解于液态焊料中,导致原始铅中的Pb含量> 20 at。%在温度范围内的热循环测试(TCT)中,90Pb10Sn / SnInAgCu接头的特征寿命几乎是90Pb10Sn / 95.5Sn4Ag0.5Cu接头的特征寿命的两倍从-40摄氏度到125摄氏度之间,据预测这主要是由于SnPbInAgCu合金比SnPbAgCu合金具有更好的抗疲劳性。铟在低温下促进了金属间化合物(IMC)层的生长共烧陶瓷(LTCC)的金属化/焊料界面并在TCT期间导致IMC颗粒变粗,但是这些现象对测试接头的蠕变/疲劳耐久性没有重大影响。

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