首页> 外文期刊>Semiconductors >Schottky contacts to high-resistivity epitaxial GaAs layers for detectors of particles and X- or γ-ray photons
【24h】

Schottky contacts to high-resistivity epitaxial GaAs layers for detectors of particles and X- or γ-ray photons

机译:肖特基接触高阻外延GaAs层,用于粒子和X射线或γ射线光子探测器

获取原文
获取原文并翻译 | 示例
           

摘要

The electrical characteristics of Ti and Pt Schottky contacts to epitaxial n-GaAs layers with the charge-carrier concentration < 10 ~(12) cm ~(-3) for detectors of particles and X- or γ-ray photons are studied. It is shown that it is preferable to use a diffusion-based theory of charge transport in calculations of the parameters of Schottky contacts to thick high-resistivity lightly compensated GaAs layers. The calculated barrier heights were 0.84 and 0.87 eV for the Ti and Pt contacts, respectively. The fabricated samples of the surface-barrier detectors featured a linear response in the studied range of energies from 6 to 140 keV for γ-ray photons and from 4 to 8 MeV for α particles; the efficiency of charge collection was close to 100% and the energy resolution was high at room temperature.
机译:研究了Ti和Pt肖特基接触到载流子浓度<10〜(12)cm〜(-3)的外延n-GaAs层的电学特性,用于粒子和X射线或γ射线光子探测器。结果表明,在计算厚厚的高电阻轻补偿GaAs层的肖特基接触的参数时,最好使用基于扩散的电荷传输理论。 Ti和Pt触点的计算出的势垒高度分别为0.84和0.87 eV。所制造的表面势垒检测器样品在γ射线光子的能量范围为6至140 keV,α粒子的能量范围为4至8 MeV时具有线性响应。室温下电荷收集效率接近100%,能量分辨率高。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号