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Features of the Formation of Porous Alumina Mask for Local Plasma Etching of Semiconductors

机译:半导体局部等离子刻蚀多孔氧化铝掩模的形成特征

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The features of formation of porous alumina masks for silicon nanoprofiling were investigated.The influence of micromorphology on the property of the local etching of silicon on the interface of an anodized double-layer structure of Al–Ti was shown. The correlation between the aspect ratio of alumina pores and the geometrical parameters of the porous silicon was investigated.
机译:研究了用于硅纳米轮廓分析的多孔氧化铝掩模的形成特征。显示了微观形貌对阳极氧化铝双层结构界面上硅局部刻蚀特性的影响。研究了氧化铝孔的长径比与多孔硅的几何参数之间的相关性。

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