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Channel length scaling in graphene field-effect transistors studied with pulsed current-voltage measurements

机译:用脉冲电流-电压测量研究石墨烯场效应晶体管的沟道长度定标

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We investigate current saturation at short channel lengths in graphene field-effect transistors (GFETs). Saturation is necessary to achieve low-output conductance required for device power gain. Dual-channel pulsed current-voltage measurements are performed to eliminate the significant effects of trapped charge in the gate dielectric, a problem common to all oxide-based dielectric films on graphene. With pulsed measurements, graphene transistors with channel lengths as small as 130 nm achieve output conductance as low as 0.3 mS/μm in saturation. The transconductance of the devices is independent of channel length, consistent with a velocity saturation model of high-field transport. Saturation velocities have a density dependence consistent with diffusive transport limited by optical phonon emission.
机译:我们研究石墨烯场效应晶体管(GFET)中短沟道长度的电流饱和。为了获得器件功率增益所需的低输出电导,饱和是必要的。执行双通道脉冲电流-电压测量以消除栅电介质中捕获的电荷的显着影响,这是石墨烯上所有基于氧化物的电介质膜所共有的问题。通过脉冲测量,沟道长度小至130 nm的石墨烯晶体管在饱和时的输出电导低至0.3 mS /μm。器件的跨导与通道长度无关,与高场传输的速度饱和模型一致。饱和速度的密度依赖性与受光声子发射限制的扩散传输一致。

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