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Manufacturing of membranes by laser ablation in SiC, sapphire, glass and ceramic for GaN/ferroelectric thin film MEMS and pressure sensors

机译:通过SiC,蓝宝石,玻璃和陶瓷中的激光烧蚀来制造膜,用于GaN /铁电薄膜MEMS和压力传感器

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摘要

AlGaN/GaN-based high electron mobility transistors (HEMTs), Schottky diodes and/or resistors have been presented as sensing devices for mechanical or chemical sensors operating in extreme conditions. Creation of appropriate diaphragms and/or cantilevers out of substrate materials is necessary for further improvement of sensing properties of such MEMS sensors. The sensitivity of the AlGaN/GaN based MEMS pressure sensor can be modified by membrane thickness. In case of SiC as substrate material of the epitaxial AlGaN/GaN heterostructure layers, we applied laser ablation technique for micromachining of the membranes. We were able to verify the feasibility of this process by fabrication of micromechanical membrane structures also in bulk 3C-SiC, borosilicate glass, sapphire and Al2O3 ceramic substrates by femtosecond laser (520 nm) ablation. On a 350 A mu m-thick 4H-SiC substrate we produced an array of 275 A mu m deep and 1000-3000 A mu m in diameter blind holes without damaging the 2 A mu m GaN layer at the back side. Our experiments indicate that pinhole defects in the ablated membranes are affected by ripple structures related to the polarization of the laser. We developed an ablation technique inhibiting the formation of pin holes caused by laser induced periodic surface structures (LIPSS).
机译:已经提出了基于AlGaN / GaN的高电子迁移率晶体管(HEMT),肖特基二极管和/或电阻器,作为在极端条件下运行的机械或化学传感器的传感装置。为了进一步改善这种MEMS传感器的传感特性,必须在基底材料之外创建合适的膜片和/或悬臂。基于AlGaN / GaN的MEMS压力传感器的灵敏度可以通过膜厚度来修改。在SiC作为外延AlGaN / GaN异质结构层的衬底材料的情况下,我们将激光烧蚀技术应用于膜的微加工。我们能够通过飞秒激光(520 nm)烧蚀在块状3C-SiC,硼硅酸盐玻璃,蓝宝石和Al2O3陶瓷基板中制造微机械膜结构,从而验证此工艺的可行性。在350 A微米厚的4H-SiC衬底上,我们生产了一个275 A微米深,直径为1000-3000 A微米的盲孔阵列,而没有损坏背面的2 A微米GaN层。我们的实验表明,烧蚀膜中的针孔缺陷受与激光偏振有关的波纹结构的影响。我们开发了一种消融技术,可抑制激光诱导的周期性表面结构(LIPSS)引起的针孔形成。

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