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首页> 外文期刊>Materials transactions >Dynamic Filling Characteristics of a Capillary Driven Underfill Process in Flip-Chip Packaging
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Dynamic Filling Characteristics of a Capillary Driven Underfill Process in Flip-Chip Packaging

机译:倒装芯片包装中毛细管驱动的底部填充工艺的动态填充特性

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This study investigates the dynamic flow characteristics of capillary-driven underfill flows in a flip chip package. In the present study, we used two different bump arrays using Sn-2.5Ag solder balls with 80 urn and 100 μm diameters on commercially available flip chips, which have different pitches of 150 urn and 180 μm. First, we measured surface tension and viscosity with a rheometer and a tensiometer, respectively, and conducted an experimental visualization of the dynamic filling behavior of the underfill flows. From the captured images, we estimated the filling times, which can be affected by two important factors: bump arrangements and resin viscosities. In addition, we conducted a FVM (finite volume mefhod)-based numerical simulation using commercial CFD code (Fluent v. 6.3.26), and compared its numerical results to both the experimental data and the analytical solutions given by the previous model described by Wan et al. (2005). The numerical predictions and analytical solutions estimating filling time were in good agreement with the experimental data, and the increase in spatial density of solder bumps allowed the flow to fill more slowly due to the increase in flow resistance. We conclude that the non-Newtonian characteristics and bump arrangement are very important factors in the design of flip-chip packaging.
机译:这项研究调查了倒装芯片封装中毛细管驱动的底部填充流的动态流动特性。在本研究中,我们在市售的倒装芯片上使用两种不同的凸块阵列,它们使用直径为80 n和100微米的Sn-2.5Ag焊球,间距为150 n和180微米。首先,我们分别使用流变仪和张力计测量表面张力和粘度,并对底部填充流的动态填充行为进行了实验可视化。从捕获的图像中,我们估计了填充时间,该时间可能受两个重要因素的影响:凸点排列和树脂粘度。此外,我们使用商业CFD代码(Fluent v。6.3.26)进行了基于FVM(有限体积法)的数值模拟,并将其数值结果与实验数据和以前模型描述的解析解决方案进行了比较。 Wan等。 (2005)。估计填充时间的数值预测和解析解与实验数据非常吻合,并且由于流阻的增加,焊锡凸块空间密度的增加使流填充变得更慢。我们得出结论,非牛顿特性和凸块排列是倒装芯片封装设计中非常重要的因素。

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