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Development of disk ultramicroelectrodes based on low melting or softening point metal fibers by low temperature plasma enhanced chemical vapor deposition

机译:通过低温等离子体增强化学气相沉积技术开发基于低熔点或软化点金属纤维的盘形超电极

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摘要

A procedure of insulating the low melting or softening point metal fibers for preparing disk ultramicroelectrodes (UMEs) is presented that employs low temperature plasma enhanced chemical vapor deposition (PECVD) technique.Specially,the development of Au disk UME is described.The 25 mum diameter Au fibers are concentrically coated by PECVD with an insulating layer of silicon nitride thin film that is performed with lower PECVD electrode temperature of 340 +- 10 deg C.The silicon nitride thin films are found to be free of microcracks and characterized with excellent adhesion at the silicon nitride thin film-Au interfaces by scanning electron microscopy measurements.The corrosion resistance is investigated on exposure to the normal saline that indicates the fabricated disk UMEs can be used as the disposable basal electrodes.Prior to the electrochemical experiments the surgical scissors are used to produce tip surfaces.The electrochemical responses are sigmoidal in shape at different scan rates and indicate that the fabricated disk electrodes exhibit electrochemical response of UMEs.The data of cyclic voltammetry show that the diffusion-limited steady-state current of the electrode tip produced by the surgical scissors is too large for a 25 mum diameter disk electrode,so a polishing machine should be specifically developed to produce the electrode active surface for the quantitative analyses of disk UMEs with small overall size based on PECVD technique.
机译:提出了一种利用低温等离子体增强化学气相沉积(PECVD)技术对低熔点或软化点金属纤维进行绝缘的方法,以制备圆盘超微电极(UME)。特别地,描述了金圆盘UME的发展。直径为25um通过PECVD将Au纤维同心地涂上一层氮化硅薄膜绝缘层,该绝缘层是在340±10摄氏度的较低PECVD电极温度下进行的。发现氮化硅薄膜没有微裂纹,并且在以下条件下具有出色的附着力通过扫描电子显微镜测量氮化硅薄膜-Au界面。研究了在生理盐水中的耐腐蚀性,表明制成的圆盘UME可用作一次性基电极。在电化学实验之前,使用手术剪刀产生尖端表面。不同扫描的电化学响应呈S形循环伏安法的数据表明,对于直径为25μm的圆盘电极,手术剪刀产生的电极尖端的扩散限制稳态电流太大,因此,它对UMEs具有电化学反应。应专门开发抛光机以生产电极活性表面,以基于PECVD技术对小尺寸的磁盘UME进行定量分析。

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